发明名称 RAMBUS HANDLER
摘要 PURPOSE: A RAMBUS handler is provided to improve the reliability of a test by automatically testing a RAMBUS type semiconductor device, such as a PGA or CSP. CONSTITUTION: A RAMBUS handler comprises a user tray stacker(100) for stacking user trays in which devices are loaded. A device loading section(200) having two row varying hands(210) is provided to pick-up a device from the user tray(10) so as to convey the device to a boat provided in a loading position. A pre-heating chamber(300) is provided to sequentially descend the boat conveyed from the device loading section(200) to the inlet formed in an upper portion. The pre-heating chamber(300) heats or cools the boat based on the test conditions thereof. A test chamber(400) is provided to perform the test by connecting the pre-heated device to a socket of a test head. A recovery chamber(500) is provided to sequentially lift the boat. The device is withdrawn to the upper portion by the recovery chamber(500). A device dividing section(600) having a plurality of one-row varying hand(640) is provided to pick-up the device from the boat which is withdrawn from the recovery chamber(500). A device unloading section(700) is provided to load the device into the user tray.
申请公布号 KR20010060303(A) 申请公布日期 2001.07.06
申请号 KR20000066867 申请日期 2000.11.10
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 KIM, NAM HYEONG;LEE, BEOM HUI;SIM, JAE GYUN
分类号 G01R31/26;B65G47/91;G01R31/28;(IPC1-7):H01L21/66 主分类号 G01R31/26
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