发明名称 |
METHOD FOR MANUFACTURING SEMICONDUCTOR MEMORY DEVICE WITH SELF-ALIGNED CONTACT |
摘要 |
PURPOSE: A method for manufacturing a semiconductor memory device with a self-aligned contact is provided to prevent a damage of a conductive layer such as a bit line or a gate line generated by an SAC(Self-Aligned Contact) etching process. CONSTITUTION: A conductive layer pattern is formed on an upper portion of a semiconductor substrate(12). An insulating layer(20) is formed to cover the conductive layer pattern. In the process for forming the insulating layer, a void(22) is form uniformly between the conductive layer patterns. A contact hole(24) for exposing a semiconductor substrate(12) is formed by etching the insulating layer(20). An upper conductive layer is formed to be contacted the semiconductor substrate(12) through the contact hole.
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申请公布号 |
KR20010058679(A) |
申请公布日期 |
2001.07.06 |
申请号 |
KR19990066035 |
申请日期 |
1999.12.30 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
LEE, JU WON |
分类号 |
H01L21/28;(IPC1-7):H01L21/28 |
主分类号 |
H01L21/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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