发明名称 METHOD FOR MANUFACTURING SEMICONDUCTOR MEMORY DEVICE WITH SELF-ALIGNED CONTACT
摘要 PURPOSE: A method for manufacturing a semiconductor memory device with a self-aligned contact is provided to prevent a damage of a conductive layer such as a bit line or a gate line generated by an SAC(Self-Aligned Contact) etching process. CONSTITUTION: A conductive layer pattern is formed on an upper portion of a semiconductor substrate(12). An insulating layer(20) is formed to cover the conductive layer pattern. In the process for forming the insulating layer, a void(22) is form uniformly between the conductive layer patterns. A contact hole(24) for exposing a semiconductor substrate(12) is formed by etching the insulating layer(20). An upper conductive layer is formed to be contacted the semiconductor substrate(12) through the contact hole.
申请公布号 KR20010058679(A) 申请公布日期 2001.07.06
申请号 KR19990066035 申请日期 1999.12.30
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 LEE, JU WON
分类号 H01L21/28;(IPC1-7):H01L21/28 主分类号 H01L21/28
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