发明名称 |
METHOD FOR MANUFACTURING MOS TRANSISTOR OF SEMICONDUCTOR DEVICE |
摘要 |
PURPOSE: A method for manufacturing a MOS transistor of a semiconductor device is provided to form widely a contact electrode for bit line and storage node by forming a source/drain junction on a substrate under an edge of the gate electrode. CONSTITUTION: A field oxide layer(12) is formed on a semiconductor substrate(10). A gate oxide layer(14) is formed on the semiconductor substrate(10). A conductive material is deposited on the gate oxide layer(14). A gate electrode is formed by patterning the gate oxide layer(14). A capping layer(20) is formed on the gate electrode(14). An LDD region(22) is formed on the substrate(10) under an edge of the gate electrode. A spacer(24) is formed at a side of the gate electrode. A high density doped polysilicon layer(26) is formed on the structure. A source/drain junction(28) is formed by diffusing the high density doped polysilicon layer(26). An interlayer dielectric(30) is formed on the substrate(10). A contact electrode(32) is formed by forming a contact hole on the interlayer dielectric(30) and burying the conductive material therein.
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申请公布号 |
KR20010058453(A) |
申请公布日期 |
2001.07.06 |
申请号 |
KR19990065785 |
申请日期 |
1999.12.30 |
申请人 |
HYNIX SEMICONDUCTOR INC. |
发明人 |
JUNG, SEUNG JO;KANG, CHI JUNG;YOO, SEUNG JONG |
分类号 |
H01L29/78;(IPC1-7):H01L29/78 |
主分类号 |
H01L29/78 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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