| 摘要 |
PROBLEM TO BE SOLVED: To provide a test circuit of a semiconductor device in which fault can be recognized even when a switching circuit and a memory are broken down simultaneously, when output from plural memories incorporated in each semiconductor device is switched and tested using the same signal for test. SOLUTION: This test circuit is provided with a memory input selector 3 switching a signal at the time of normal operation or a signal for test and inputting it to each memory 1, a memory output selector 8 switching output of each memory and outputting it, a test control circuit 7 controlling supply of a signal for test for a memory input selector and respective switching of each selector, and a first logic circuit 9 inserted between a memory and a memory output selector. The first logic circuit adds change being different for each memory to output signal of plural memories.
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