发明名称 METHOD FOR FORMING CAPACITOR OF SEMICONDUCTOR DEVICE
摘要 PURPOSE: A method for forming a capacitor is to improve the characteristic and reliability of the semiconductor device by an exposing and developing process using two storage electrode masks. CONSTITUTION: The first interlayer dielectric(3) is formed on the entire structure. The first contact plug(4) is formed to be connected to the active region through the first interlayer dielectric. A bit line is formed to connect to the bit line contact plug. The second interlayer dielectric(7) is formed on the entire structure. The bit line has a sidewall and spacer nitride layer(5). A sacrificial oxide layer(9) is formed on the entire structure. A photoresist pattern is formed on the sacrificial oxide layer. A sacrificial oxide layer pattern is formed by etching the sacrificial oxide layer, using the photoresist pattern as a mask. Then, the photoresist pattern is removed. A storage electrode conductive layer(11) is formed on the entire structure including the sacrificial oxide layer pattern.
申请公布号 KR20010058940(A) 申请公布日期 2001.07.06
申请号 KR19990066316 申请日期 1999.12.30
申请人 HYNIX SEMICONDUCTOR INC. 发明人 BAE, GYEONG JIN;KIM, YEONG SU
分类号 H01L27/108;(IPC1-7):H01L27/108 主分类号 H01L27/108
代理机构 代理人
主权项
地址