发明名称 |
METHOD FOR FORMING CAPACITOR OF SEMICONDUCTOR DEVICE |
摘要 |
PURPOSE: A method for forming a capacitor is to improve the characteristic and reliability of the semiconductor device by an exposing and developing process using two storage electrode masks. CONSTITUTION: The first interlayer dielectric(3) is formed on the entire structure. The first contact plug(4) is formed to be connected to the active region through the first interlayer dielectric. A bit line is formed to connect to the bit line contact plug. The second interlayer dielectric(7) is formed on the entire structure. The bit line has a sidewall and spacer nitride layer(5). A sacrificial oxide layer(9) is formed on the entire structure. A photoresist pattern is formed on the sacrificial oxide layer. A sacrificial oxide layer pattern is formed by etching the sacrificial oxide layer, using the photoresist pattern as a mask. Then, the photoresist pattern is removed. A storage electrode conductive layer(11) is formed on the entire structure including the sacrificial oxide layer pattern.
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申请公布号 |
KR20010058940(A) |
申请公布日期 |
2001.07.06 |
申请号 |
KR19990066316 |
申请日期 |
1999.12.30 |
申请人 |
HYNIX SEMICONDUCTOR INC. |
发明人 |
BAE, GYEONG JIN;KIM, YEONG SU |
分类号 |
H01L27/108;(IPC1-7):H01L27/108 |
主分类号 |
H01L27/108 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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