发明名称 INTEGRATED CIRCUIT ANALYSIS DEVICE
摘要 PROBLEM TO BE SOLVED: To calculate the operation (qualitative change of potential) of an integrated circuit without conducting difficult work on the calculation of the operation of the integrated circuit by electronic circuit simulation, which is strict circuit element extraction and strict decision of a circuit element parameter. SOLUTION: A layout graph extraction means 102 storing layout graph information to which information on a node and an arc as graph information are added of the integrated circuit, a potential transmission parameter rendering means 113 storing an electric characteristic variation rule where a method that the respective nodes electrically influence each other is individually described on the nodes and the arcs in an integrated circuit network, an initial condition setting means 108 giving the initial condition of layout graph information, a driving signal output means 107 giving the integrated circuit driving signal, and electric characteristics variation calculating means 111 and 106 calculating an electric behavior change on the nodes and the arc for the integrated circuit network initialized by the initial condition setting means in accordance with the electric characteristics variation rule are provided.
申请公布号 JP2001184374(A) 申请公布日期 2001.07.06
申请号 JP19990367075 申请日期 1999.12.24
申请人 TOSHIBA CORP 发明人 NIINA HIROSHI;KIJI JIYUNICHI;KUMAGAI JUNPEI;USAMI MASAMI;KAKINUMA HIDENORI
分类号 G01R31/28;G06F17/50;H01L21/82;H01L29/00;(IPC1-7):G06F17/50 主分类号 G01R31/28
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