发明名称 |
METHOD FOR FORMING METAL LINE OF SEMICONDUCTOR DEVICE |
摘要 |
PURPOSE: A method for forming a metal line of a semiconductor device is provided to bury a W without generating a void by using an ALD(Atomic Layer Deposition) process. CONSTITUTION: A contact and a via hole are formed on an upper portion of a semiconductor substrate formed with a lower metal layer. An interlayer dielectric is formed on the whole structure. A contact or a via hole is formed by etching a part of the interlayer dielectric. A W ALD layer is formed on the whole structure by introducing a WF6 gas/purge gas/H2 gas or a SiO4 gas/purge gas. The remaining W except for the W of the inside of the hole is etched back.
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申请公布号 |
KR20010059541(A) |
申请公布日期 |
2001.07.06 |
申请号 |
KR19990067058 |
申请日期 |
1999.12.30 |
申请人 |
HYNIX SEMICONDUCTOR INC. |
发明人 |
KWON, HYEOK JIN;YOON, JONG HO |
分类号 |
H01L21/28;(IPC1-7):H01L21/28 |
主分类号 |
H01L21/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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