发明名称 METHOD FOR FORMING METAL LINE OF SEMICONDUCTOR DEVICE
摘要 PURPOSE: A method for forming a metal line of a semiconductor device is provided to bury a W without generating a void by using an ALD(Atomic Layer Deposition) process. CONSTITUTION: A contact and a via hole are formed on an upper portion of a semiconductor substrate formed with a lower metal layer. An interlayer dielectric is formed on the whole structure. A contact or a via hole is formed by etching a part of the interlayer dielectric. A W ALD layer is formed on the whole structure by introducing a WF6 gas/purge gas/H2 gas or a SiO4 gas/purge gas. The remaining W except for the W of the inside of the hole is etched back.
申请公布号 KR20010059541(A) 申请公布日期 2001.07.06
申请号 KR19990067058 申请日期 1999.12.30
申请人 HYNIX SEMICONDUCTOR INC. 发明人 KWON, HYEOK JIN;YOON, JONG HO
分类号 H01L21/28;(IPC1-7):H01L21/28 主分类号 H01L21/28
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