发明名称 |
METHOD FOR FLATTENING INTERLAYER INSULATING FILM IN SEMICONDUCTOR DEVICES |
摘要 |
PURPOSE: A method for flattening an interlayer insulating film is provided to minimize a side effect depending on the thermal load due to lowered temperature of a thermal process and efficiently improve the process time and the equipment operation. CONSTITUTION: A method for flattening an interlayer insulating film forms a borophosphoric silicate glass(BPSG) film on a given underlying layer. The BPSG film is flowed by implementing a rapid thermal annealing process under vapor atmospHere. The process of forming the BPSG film includes forming a conductive line on a given underlying layer and depositing the BPSG film in 5000-10000Å. At this time, the doping concentration of P ions and B ions are controlled to form an undoped silicate glass film into which P ions and B ions are not doped in 1500-2500Å.
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申请公布号 |
KR20010058618(A) |
申请公布日期 |
2001.07.06 |
申请号 |
KR19990065970 |
申请日期 |
1999.12.30 |
申请人 |
HYNIX SEMICONDUCTOR INC. |
发明人 |
KIM, JIN HYEON;SEO, YUN SEOK |
分类号 |
H01L21/316;(IPC1-7):H01L21/316 |
主分类号 |
H01L21/316 |
代理机构 |
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