发明名称 |
FLASH MEMORY DEVICE |
摘要 |
PURPOSE: A flash memory device is provided to lower topology between a cell region and a peripheral region by laminating an NON(Nitride-Oxide-Nitride) layer instead of an existing ONO(Oxide-Nitride-Oxide) layer. CONSTITUTION: A tunnel oxide layer(20) and a floating gate layer(25) are laminated on a semiconductor substrate(10). An NON layer(30) as a barrier layer is formed between the floating gate layer(25) and a control gate layer(35). The control gate layer(35) is laminated on the NON layer(30). A gate is formed by performing a masking etching process. A source/drain region(15) is formed by implanting ions into an active region.
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申请公布号 |
KR20010058485(A) |
申请公布日期 |
2001.07.06 |
申请号 |
KR19990065818 |
申请日期 |
1999.12.30 |
申请人 |
HYNIX SEMICONDUCTOR INC. |
发明人 |
JUN, YUN SEOK;KIM, DONG JIN;LEE, SEUNG CHEOL |
分类号 |
H01L27/115;(IPC1-7):H01L27/115 |
主分类号 |
H01L27/115 |
代理机构 |
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