发明名称 FLASH MEMORY DEVICE
摘要 PURPOSE: A flash memory device is provided to lower topology between a cell region and a peripheral region by laminating an NON(Nitride-Oxide-Nitride) layer instead of an existing ONO(Oxide-Nitride-Oxide) layer. CONSTITUTION: A tunnel oxide layer(20) and a floating gate layer(25) are laminated on a semiconductor substrate(10). An NON layer(30) as a barrier layer is formed between the floating gate layer(25) and a control gate layer(35). The control gate layer(35) is laminated on the NON layer(30). A gate is formed by performing a masking etching process. A source/drain region(15) is formed by implanting ions into an active region.
申请公布号 KR20010058485(A) 申请公布日期 2001.07.06
申请号 KR19990065818 申请日期 1999.12.30
申请人 HYNIX SEMICONDUCTOR INC. 发明人 JUN, YUN SEOK;KIM, DONG JIN;LEE, SEUNG CHEOL
分类号 H01L27/115;(IPC1-7):H01L27/115 主分类号 H01L27/115
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