发明名称 |
SEMICONDUCTOR DEVICE AND ITS MANUFACTURING METHOD |
摘要 |
PROBLEM TO BE SOLVED: To obtain a semiconductor device having a contact structure comprising a highly reliable multi-layer conductive plug by stabilizing electrical connection between upper and lower conductive plugs while preventing short circuit between a conductive plug and an electrode layer. SOLUTION: A reflection prevention film 5 used when a first contact hole 6 is formed is interposed between a first insulation film 4 and a second insulation layer 80 and the reflection prevention film 5 is made an etching prevention film to the first insulation film 4 when a second contact hole 9 is formed in the second insulation layer 80. |
申请公布号 |
JP2001185614(A) |
申请公布日期 |
2001.07.06 |
申请号 |
JP19990363933 |
申请日期 |
1999.12.22 |
申请人 |
MITSUBISHI ELECTRIC CORP |
发明人 |
KAWAI KENJI |
分类号 |
H01L21/027;H01L21/768;H01L21/8234;H01L21/8242;H01L23/522;H01L23/532;H01L27/088;H01L27/108;H01L29/78 |
主分类号 |
H01L21/027 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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