发明名称 SENSOR ABNORMALITY DETECTING CIRCUIT AND PHYSICAL QUANTITY DETECTING DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a small-sized abnormality detecting circuit capable of accurately detecting abnormalities without delay in a sensor 10 in which the output voltages V1 and BV2 of a pair of output terminals J1 and J2 each change from a predetermined equilibrium-point voltage according to the physical quantity of an object to be detected by the same amount in the positive direction and negative direction. SOLUTION: The abnormality detecting circuit is provided with reference-voltage generating circuits 21-24 to generate the same voltage VE as the equilibrium-point voltage of the sensor 10, an operational amplifier 12 in which the voltage VE is inputted to its non-inverse input terminal and a resistance 15 is connected between is output terminal and inverse input terminal, a resistance 13 in which one output voltage V1 of the sensor 10 is impressed on its one end and its other end is connected to the inverse input terminal of the operational amplifier 12, a resistance 14 in which the other output voltage V2 of the sensor 10 is impressed in its one end, its other end is connected to the inverse input terminal of the operational amplifier 12, and its resistance value is set at the same value as that of the resistance 13, and a determining circuit 16 to output a signal indicating an anomaly in the case that the output voltage of the operational amplifier 12 lies outside a predetermined voltage range (VE±α).
申请公布号 JP2001183165(A) 申请公布日期 2001.07.06
申请号 JP20000229236 申请日期 2000.07.28
申请人 DENSO CORP 发明人 TANIZAWA YUKIHIKO
分类号 G01L9/04;G01D5/12;G01D5/16;G01L9/00;G01L27/00;(IPC1-7):G01D5/12 主分类号 G01L9/04
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