发明名称 METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE
摘要 PURPOSE: A method for manufacturing a semiconductor device is provided to form a gate electrode by performing a damascene process using a dummy layer. CONSTITUTION: A photoresist pattern is formed on a gate electrode formation portion of a semiconductor substrate(31). A dielectric layer(33) is formed on a whole face of the structure. The photoresist layer and the dielectric layer(33) are etched to expose the semiconductor substrate(31). A gate insulating layer and a metal layer are formed on the dielectric layer(33) and the exposed substrate. A gate electrode is formed by etching back the metal layer and the gate insulating layer. The dielectric layer(33) is removed.
申请公布号 KR20010059463(A) 申请公布日期 2001.07.06
申请号 KR19990066968 申请日期 1999.12.30
申请人 HYNIX SEMICONDUCTOR INC. 发明人 KIM, GWANG OK;KIM, JAE YEONG
分类号 H01L21/28;(IPC1-7):H01L21/28 主分类号 H01L21/28
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