发明名称 |
METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE |
摘要 |
PURPOSE: A method for manufacturing a semiconductor device is provided to form a gate electrode by performing a damascene process using a dummy layer. CONSTITUTION: A photoresist pattern is formed on a gate electrode formation portion of a semiconductor substrate(31). A dielectric layer(33) is formed on a whole face of the structure. The photoresist layer and the dielectric layer(33) are etched to expose the semiconductor substrate(31). A gate insulating layer and a metal layer are formed on the dielectric layer(33) and the exposed substrate. A gate electrode is formed by etching back the metal layer and the gate insulating layer. The dielectric layer(33) is removed.
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申请公布号 |
KR20010059463(A) |
申请公布日期 |
2001.07.06 |
申请号 |
KR19990066968 |
申请日期 |
1999.12.30 |
申请人 |
HYNIX SEMICONDUCTOR INC. |
发明人 |
KIM, GWANG OK;KIM, JAE YEONG |
分类号 |
H01L21/28;(IPC1-7):H01L21/28 |
主分类号 |
H01L21/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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