发明名称 Method of forming titanium silicide and titanium by chemical vapor deposition and resulting apparatus
摘要 A method is provided for forming a contact in an integrated circuit by chemical vapor deposition (CVD). In one embodiment, a titanium precursor and a silicon precursor are contacted in the presence of hydrogen, to form titanium silicide. In another embodiment, a titanium precursor contacts silicon to form to form titanium silicide.
申请公布号 US2001006240(A1) 申请公布日期 2001.07.05
申请号 US20010789999 申请日期 2001.02.21
申请人 MICRON TECHNOLOGY INC. 发明人 DOAN TRUNG T.;SANDHU GURTEJ SINGH;PRALL KIRK;SHARAN SUJIT
分类号 C23C16/02;C23C16/14;C23C16/42;H01L21/28;H01L21/285;H01L21/768;(IPC1-7):H01L27/108;H01L29/76;H01L29/94;H01L31/119 主分类号 C23C16/02
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