发明名称 Slurry for chemical mechanical polishing
摘要 In chemical mechanical polishing of a substrate comprising a tantalum-containing metal film, a slurry for chemical mechanical polishing comprising a silica polishing grain and an inorganic salt in an amount of 0.01 wt % to 10 wt % both inclusive may be used to prevent dishing and erosion, as well as to achieve an improved polishing rate for tantalum without any damage to tantalum.
申请公布号 US2001006224(A1) 申请公布日期 2001.07.05
申请号 US20000741408 申请日期 2000.12.20
申请人 TSUCHIYA YASUAKI;WAKE TOMOKO;ITAKURA TETSUYUKI;SAKURAI SHIN;AOYAGI KENICHI 发明人 TSUCHIYA YASUAKI;WAKE TOMOKO;ITAKURA TETSUYUKI;SAKURAI SHIN;AOYAGI KENICHI
分类号 B24B37/00;C09G1/02;C09K3/14;C23F3/00;H01L21/304;H01L21/321;H01L21/768;(IPC1-7):C09K5/00 主分类号 B24B37/00
代理机构 代理人
主权项
地址