| 摘要 |
<p>The invention concerns a method for temperature compensation in an image sensor comprising photosensitive points (O1 to O6, R1 to R9) sensitive to room temperature, each connected to a line conductor (Y1 to Y3) and a column conductor (W1, W2, Z1 to Z3). Each of the photosensitive points is connected by one of its conductors to a reading circuit (30a, 30b). The photosensitive points are divided into sensing photosensitive points (R1 to R9) designed to be exposed to a light information translating the image to be detected, the reading circuits (30b) associated with said photosensitive points delivering each a measurement voltage representing the image to be detected and into blind photosensitive points (O1 to O6) protected from the light information, the reading circuits (30a) associated with said blind sensitive points delivering each a darkness voltage enabling temperature compensation. When an image is detected, the method consists in collecting darkness voltages derived from one or several detected images and in using the average correction value to generate a correction voltage (VDR) to be applied, when a subsequent image is detected, to the reading circuits (30b) associated with the sensing photosensitive points (R1 to R9) so that they deliver a substantially temperature-independent measurement voltage. The invention is particularly applicable to radiological image detectors.</p> |
