发明名称 SEMICONDUCTOR WAFER CUTTING APPARATUS
摘要 PURPOSE: A semiconductor wafer cutting apparatus is provided to prevent DI water under a high pressure and Si dust from remaining on a wafer by using a high-pressure air spray means within a process chamber. CONSTITUTION: A semiconductor wafer cutting apparatus includes a process chamber for performing a wafer cutting work. The process chamber has an air spray means(51) for cleaning DI water and Si dust remaining on a wafer(9), a driving unit(36) moved in a 2 axis(X,Y axis) and a wafer sensing unit for sensing a chuck table(8) for fixing/transferring the driving unit and the wafer. A wafer supply unit supplies the wafer to be cut into the process chamber. A cleaning unit cleans the cut wafer. A control unit controls respective functions of the apparatus. A monitor unit monitors an operation situation within the process chamber.
申请公布号 KR20010057196(A) 申请公布日期 2001.07.04
申请号 KR19990059146 申请日期 1999.12.20
申请人 HYNIX SEMICONDUCTOR INC. 发明人 KIM, JIN GU;SIM, DONG GI
分类号 H01L21/304;(IPC1-7):H01L21/304 主分类号 H01L21/304
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