发明名称 |
METHOD FOR PROCESSING PLASMA IN SEMICONDUCTOR MANUFACTURING APPARATUS |
摘要 |
PURPOSE: A method for processing plasma is provided to efficiently remove reaction by-products while minimizing generation of contaminant particles caused in a cleaning process during a plasma process. CONSTITUTION: A method for processing plasma etches a silicon film quality on a wafer within a reaction chamber using plasma generated from a halogen-group element-containing gas while supplying RF electric field to the reaction chamber. The interior of the reaction chamber is cleaned using plasma generated from gas containing O2 gas while reducing the power of the RF electric field applied to the reaction chamber by a given ramping rate.
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申请公布号 |
KR20010056698(A) |
申请公布日期 |
2001.07.04 |
申请号 |
KR19990058275 |
申请日期 |
1999.12.16 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
KIM, JEONG JU;PARK, HUI JEONG;SHIN, EUN HUI;TAE, GI YEONG |
分类号 |
H01L21/3065;(IPC1-7):H01L21/306 |
主分类号 |
H01L21/3065 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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