发明名称 METHOD FOR PROCESSING PLASMA IN SEMICONDUCTOR MANUFACTURING APPARATUS
摘要 PURPOSE: A method for processing plasma is provided to efficiently remove reaction by-products while minimizing generation of contaminant particles caused in a cleaning process during a plasma process. CONSTITUTION: A method for processing plasma etches a silicon film quality on a wafer within a reaction chamber using plasma generated from a halogen-group element-containing gas while supplying RF electric field to the reaction chamber. The interior of the reaction chamber is cleaned using plasma generated from gas containing O2 gas while reducing the power of the RF electric field applied to the reaction chamber by a given ramping rate.
申请公布号 KR20010056698(A) 申请公布日期 2001.07.04
申请号 KR19990058275 申请日期 1999.12.16
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 KIM, JEONG JU;PARK, HUI JEONG;SHIN, EUN HUI;TAE, GI YEONG
分类号 H01L21/3065;(IPC1-7):H01L21/306 主分类号 H01L21/3065
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