发明名称 METHOD FOR FORMING CONTACT HOLE USING I-LINE RESIST HAVING CHARACTERISTIC OF OXIDE LAYER
摘要 PURPOSE: A method for forming a contact hole using an I-line resist having a characteristic of an oxide layer is provided to form stably a contact hole by adding a component of an oxide layer into an I-line resist. CONSTITUTION: A substrate formed with a lower layer is provided. A surface of the substrate is processed by using an HMDS(Hexamethyl Disilazane) solution. An exposure process for the substrate is performed by using an I-line exposure system. A resist with a characteristic of an oxide layer is applied thereon. A soft bake process for the resist is performed. The exposure process for the resist is performed partially by using the I-line exposure system. A PEB(Post Exposure Bake) process for the exposed resist is performed. A resist pattern is formed by developing the exposed resist. A hard bake process for the resist pattern is performed.
申请公布号 KR20010056120(A) 申请公布日期 2001.07.04
申请号 KR19990057553 申请日期 1999.12.14
申请人 HYNIX SEMICONDUCTOR INC. 发明人 CHOI, CHANG IL;JUNG, JIN HUI
分类号 H01L21/28;(IPC1-7):H01L21/28 主分类号 H01L21/28
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