发明名称 |
METHOD FOR FORMING CONTACT HOLE USING I-LINE RESIST HAVING CHARACTERISTIC OF OXIDE LAYER |
摘要 |
PURPOSE: A method for forming a contact hole using an I-line resist having a characteristic of an oxide layer is provided to form stably a contact hole by adding a component of an oxide layer into an I-line resist. CONSTITUTION: A substrate formed with a lower layer is provided. A surface of the substrate is processed by using an HMDS(Hexamethyl Disilazane) solution. An exposure process for the substrate is performed by using an I-line exposure system. A resist with a characteristic of an oxide layer is applied thereon. A soft bake process for the resist is performed. The exposure process for the resist is performed partially by using the I-line exposure system. A PEB(Post Exposure Bake) process for the exposed resist is performed. A resist pattern is formed by developing the exposed resist. A hard bake process for the resist pattern is performed.
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申请公布号 |
KR20010056120(A) |
申请公布日期 |
2001.07.04 |
申请号 |
KR19990057553 |
申请日期 |
1999.12.14 |
申请人 |
HYNIX SEMICONDUCTOR INC. |
发明人 |
CHOI, CHANG IL;JUNG, JIN HUI |
分类号 |
H01L21/28;(IPC1-7):H01L21/28 |
主分类号 |
H01L21/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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