| 摘要 |
A circuit (10) and method for dibit detection in a mass data storage device includes concurrently operating magnitude (16), polarity (18), and peak value (20) qualification circuits. The magnitude qualification circuit (16) produces a magnitude qualification output signal when a magnitude of the read back signal exceeds a predetermined magnitude threshold. The polarity qualification circuit produces a polarity qualification output signal when a polarity of the read back signal is of a predetermined polarity. The peak value qualification circuit produces a peak value qualification output signal at a time at which a peak value of the read back signal occurs during a predetermined period. When the magnitude qualification output signal, the polarity qualification output signal, and the peak value qualification output signals simultaneously occur, a dibit detection signal (118) is produced.
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