发明名称 CHEMICAL MACHINE POLISHING METHOD, SEMICONDUCTOR DEVICE MANUFACTURING METHOD AND SEMICONDUCTOR DEVICE
摘要 <p>PROBLEM TO BE SOLVED: To provide a chemical machine polishing method for positively reducing the number of cohesive abrasive grains in a polishing slurry before supplied to the polishing device and causing less scratches on the polished surface of a material after polished. SOLUTION: In flattening the surface of a polished material, mechanical energy is applied to a polishing slurry 2 with a preset concentration of abrasive grains stored in a reservoir 1 by using a stirring rod 4 with a propeller 3 for controlling the concentration of cohesive abrasive grains in the polishing slurry 2, and then the polishing slurry 2 is introduced into the polishing device.</p>
申请公布号 JP2001179612(A) 申请公布日期 2001.07.03
申请号 JP19990370245 申请日期 1999.12.27
申请人 HITACHI LTD 发明人 SAITO AKIO;KATSUMURA NOBUHITO
分类号 B24B37/00;H01L21/304;(IPC1-7):B24B37/00 主分类号 B24B37/00
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