发明名称 |
CHEMICAL MACHINE POLISHING METHOD, SEMICONDUCTOR DEVICE MANUFACTURING METHOD AND SEMICONDUCTOR DEVICE |
摘要 |
<p>PROBLEM TO BE SOLVED: To provide a chemical machine polishing method for positively reducing the number of cohesive abrasive grains in a polishing slurry before supplied to the polishing device and causing less scratches on the polished surface of a material after polished. SOLUTION: In flattening the surface of a polished material, mechanical energy is applied to a polishing slurry 2 with a preset concentration of abrasive grains stored in a reservoir 1 by using a stirring rod 4 with a propeller 3 for controlling the concentration of cohesive abrasive grains in the polishing slurry 2, and then the polishing slurry 2 is introduced into the polishing device.</p> |
申请公布号 |
JP2001179612(A) |
申请公布日期 |
2001.07.03 |
申请号 |
JP19990370245 |
申请日期 |
1999.12.27 |
申请人 |
HITACHI LTD |
发明人 |
SAITO AKIO;KATSUMURA NOBUHITO |
分类号 |
B24B37/00;H01L21/304;(IPC1-7):B24B37/00 |
主分类号 |
B24B37/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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