发明名称 Method of fabricating self-aligning stacked capacitor using electroplating method
摘要 A method of fabricating a self-aligned stacked capacitor is provided, in which buried contacts and storage nodes are simultaneously formed by electroplating. In this method, a semiconductor substrate having exposed conductive areas is prepared for, and an interlayer insulative layer having buried contact holes that expose the conductive areas, is formed over the semiconductor substrate. A lower conductive seed layer is then formed over the entire surface of the innerwalls of the buried contact holes and the upper surface of the interlayer insulative layer. Non-conductor patterns having storage node holes that expose the buried contact holes, are then formed over the lower conductive seed layer on the upper surface of the interlayer insulative layer. A buried contact that fills the buried contact hole, and a lower electrode that fills the storage node hole, are then simultaneously formed by electroplating.
申请公布号 US6255187(B1) 申请公布日期 2001.07.03
申请号 US20000551524 申请日期 2000.04.18
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 HORII HIDEKI
分类号 H01L29/92;H01L21/02;H01L21/288;H01L21/8242;(IPC1-7):H01L21/20 主分类号 H01L29/92
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