发明名称 Damascene T-gate using a spacer flow
摘要 A method for fabricating a T-gate structure is provided. A structure is provided that has a silicon layer having a gate oxide layer, a polysilicon layer over the gate oxide layer and an insulating layer over the gate oxide layer. An opening is formed extending partially into the insulating layer. The opening in the insulating layer extends from a top surface of the insulating layer to a first depth. Spacers are then formed on the sides of the opening. The opening is then extended in the insulating layer from the first depth to a second depth. The opening is wider from the top surface of the insulating layer to the first depth than the opening is from the first depth to the second depth. The spacers are then removed from the opening. The opening is then filled with a conductive material to form a T-gate structure.
申请公布号 US6255202(B1) 申请公布日期 2001.07.03
申请号 US20000619836 申请日期 2000.07.20
申请人 ADVANCED MICRO DEVICES, INC. 发明人 LYONS CHRISTOPHER F.;SUBRAMANIAN RAMKUMAR;SINGH BHANWAR;PLAT MARINA
分类号 H01L21/28;H01L21/336;H01L21/768;H01L29/423;H01L29/49;(IPC1-7):H01L21/320 主分类号 H01L21/28
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