STRUCTURE CAPABLE OF CONTINUOUS ELECTRICAL TEST FOR INDIVIDUAL PACKAGE SUBSTRATES

摘要

PURPOSE: A structure capable of a continuous electrical test for a plurality of individual package substrates is provided to improve operation efficiency and productivity. CONSTITUTION: In the structure, the plurality of individual package substrates(110) are integrally arranged in a row, thus forming a substrate strip(160). The substrate strip(160) has cutting grooves each formed widthwise between the adjacent individual package substrates(110), and guide holes(140) formed at both end margins(170) thereof. The cutting groove facilitates an easy separation of the individual package substrate(100), and the guide hole(140) receives a fixing pin for supporting the substrate strip(160). When the substrate strip(160) is supplied to an electrical tester and fixed thereto by insertion of the fixing pin into the guide hole(140), testing probes of the electrical tester are moved down and touched on circuit pattern regions(120) of the individual package substrate(110).