发明名称 |
EXPOSURE APPARATUS WHICH CAN COMPENSATE LINE WIDTH DIFFERENCE BETWEEN LONGITUDINAL AND LATERAL PATTERNS AND APERTURE USED IN THEREOF |
摘要 |
PURPOSE: An exposure apparatus and an aperture used in thereof are provided, which can compensate for a line width difference between a longitudinal and a lateral pattern. CONSTITUTION: An aperture(40) comprises a light-shielding area(IA) having a circular external form and a transparent area(TA) comprised in the light-shielding area. The transparent area is a non-circular transparent area whose eccentricity(e) is larger than 0 and smaller than 1. The transparent area has a major axis(42) connected to the thinnest part of the light-shielding area and a minor axis(44) connected to the thickest part of the light-shielding area and being orthogonal with the major axis. The major axis is about 56 mm long and the minor axis is about 42 mm long. There can be a circular aperture having various forms of transparent area according to the length of the major axis and the minor axis.
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申请公布号 |
KR20010054399(A) |
申请公布日期 |
2001.07.02 |
申请号 |
KR19990055203 |
申请日期 |
1999.12.06 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
YOO, JI YONG;YUK, HEUNG JO |
分类号 |
H01L21/027;G03F7/20;(IPC1-7):H01L21/027 |
主分类号 |
H01L21/027 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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