| 摘要 |
PROBLEM TO BE SOLVED: To accurately predict a trouble with a given logic circuit. SOLUTION: Using a status transition diagram obtained by regarding a given logic circuit as a status transition machine, a test pattern generator 4 generates a test pattern for diagnosing resistor level trouble for testing all transitions from a status to a status. Using the test pattern generated by the test pattern generator 4, a resistor level trouble diagnosing device 5 performs the trouble diagnosis of a resistor level so as to generate the information for performing a gate level trouble diagnosis. Using this information, the gate level trouble diagnosing device 6 performs the gate level trouble diagnosis.
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