发明名称 SEMICONDUCTOR DEVICE AND ELECTRONIC DEVICE USING IT
摘要 PROBLEM TO BE SOLVED: To provide a highly reliable semiconductor device which has high manufacturing yield and an electronic device wherein it is used by restraining excess interface reaction when a chip part, especially an IC chip substrate, is fixed to a mounting member consisting of a resin material by means of a brazing material bump, and preventing breakage of a brazing part caused by thermal and mechanical change during manufacturing or operation. SOLUTION: In a semiconductor device, a semiconductor substrate is fixed on a mounting member consisting of a resin material provided with a conductor wiring in a surface by a bump which is constituted of a brazing material comprising Sn, or a brazing material comprising two or more kinds of substances selected from a group of Sn, Sb, Ag, Cu, Ni, P, Bi, Zn, Au and In. The semiconductor substrate, the bump and the mounting member are molded from thermosetting resin.
申请公布号 JP2001176927(A) 申请公布日期 2001.06.29
申请号 JP19990360360 申请日期 1999.12.20
申请人 HITACHI LTD 发明人 KURIHARA YASUTOSHI;OGAWA TOSHIO
分类号 B23K35/26;H01L21/60;H01L23/29;H01L23/31 主分类号 B23K35/26
代理机构 代理人
主权项
地址