发明名称 INTEGRATED CIRCUIT MOUNTING BOARD FOR INTEGRATED CIRCUIT LIFE TEST
摘要 PROBLEM TO BE SOLVED: To provide an integrated circuit mounting board for integrated circuit life test capable of withstanding high temperatures and preventing it from being damaged due to brittleness. SOLUTION: This integrated circuit mounting board for integrated circuit life test is so formed that, in order to test the life of wiring of a film forming an integrated circuit, a terminal 1a of a socket 1 allowing a pin terminal T provided in a package of an integrated circuit IC to be inserted and connected thereto is allowed to abut on one end 4a of a number of pieces of wiring 4 formed on an insulation film 3 on the surface of a rust-resistant metal sheet 2, the socket 1 is installed on the metal sheet 2, the other end 4b of a number of pieces of wiring 4 formed on the insulation film 3 on the surface of the metal sheet 2 is formed so as to be allowed to be inserted into the outer surface from the inner surface of a door 10 of a constant temperature oven 9 allowing the temperature to vary and allowed to be projected, the other end 4b of a number of wirings 4 formed on the insulation film 3 of the metal sheet 2 projected to the outer surface of the door 10 is inserted and connected to a cable socket 7 connected to the end of a cable 6 connected to a life tester 5.
申请公布号 JP2001174508(A) 申请公布日期 2001.06.29
申请号 JP19990360500 申请日期 1999.12.20
申请人 KAN ELECTRONICS CO LTD 发明人 UKAI HIDEO
分类号 G01R31/26;(IPC1-7):G01R31/26 主分类号 G01R31/26
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