发明名称 HIGH-VOLTAGE TEST DEVICE
摘要 <p>PROBLEM TO BE SOLVED: To provide an excellent high-voltage test device contributing to a reduction of size of a building of a laboratory by shortening an insulation distance and increasing a measurement sensitivity by suppressing the occurrence of aerial partial electric discharge. SOLUTION: Output terminals 14a and 15a extracted to the outside are formed on an impulse generator 14 and a test transformer 15 having SF 6 gas sealed therein, and a duct line bus 10 is attached to the impulse generator 14. The SF 6 gas is sealed inside the duct line bus 10, and the output terminals 14a and 15a and an output selector switch 8 are stored in the duct line bus 10. The output selector switch 8 is formed so as to connect either of the output terminals 14a and 15a selectively to transformation equipment.</p>
申请公布号 JP2001174502(A) 申请公布日期 2001.06.29
申请号 JP19990355155 申请日期 1999.12.14
申请人 TOSHIBA CORP 发明人 INOUE TAMOTSU;IKEDA MASAMI;HANAI MASAHIRO
分类号 H01F38/24;G01R31/12;(IPC1-7):G01R31/12 主分类号 H01F38/24
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