| 摘要 |
PROBLEM TO BE SOLVED: To provide a technique for reducing the overhead of test time. SOLUTION: This circuit is provided with a compactor chain 22 separately from a scan chain 21, and this compact chain compresses and takes in the data outputted from the first logical circuit 11 independent of the data of the above scan chain. As a result, the data breakage with the scan chain in compressing and taking in the data outputted from the first logical circuit is eliminated, and the update of all data of the scan chain in every test is made needless, whereby the shortening of the test time is achieved.
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