发明名称 Frequency domain analysis system for a time domain measurement instrument
摘要 <p>A frequency domain analysis system incorporated into time domain measurement instrument has duration and resolution controls that respectively adjust the acquisition time intervals of a waveform record in seconds and adjusts the number of digital data samples over a specified duration. The duration of the acquisition waveform may be controlled using the duration control adjustment (104), a sample rate adjustment (102) and a record length adjustment (100). The resolution controls (106) concurrently adjusts the sample rate and the record length of the acquisition waveform while maintaining the duration constant. A movable and variable length frequency spectrum gate (92) is applied to the digital data samples of the acquired waveform. A window filter is applied to the digital data samples within the gated region a spectrum analysis generator generates frequency domain values over the gates waveform record. The spectrum analysis generator outputs frequency domain values defined by frequency span and center frequency controls (94) associated with spectrum analysis generator. &lt;IMAGE&gt;</p>
申请公布号 EP1111396(A2) 申请公布日期 2001.06.27
申请号 EP20000310949 申请日期 2000.12.08
申请人 TEKTRONIX, INC. 发明人 PICKERD, JOHN J.;DAVIDSON, SCOTT A.
分类号 G01R23/16;G01R13/34;(IPC1-7):G01R23/16;G01R27/28 主分类号 G01R23/16
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