发明名称 Pico fuse open or short detector tool
摘要 A pico fuse detector assembly incorporating a probe structure that minimizes short-out of closely adjacent pico fuses during testing has two probe arms, each pivotably connected at one end to a detector body with their free ends adjustably dispaceable from each other and respectively accomodating improved probe elements thereon. Each probe element has a conductive lead disposed inside an insulating housing connected at one end to a set of test contacts extending from the bottom of the housing. The other end of the lead is coupled by a spring to a test circuit. The restricting of the contact area with the isolating housing limits the chance of the contacts accidentally being placed at a location to cause damage to two closely arranged adjacent pico fuses under test and thus obviates the problem of fuse short-out during measuring of the closely arranged fuses. Also, the contacts and lead are axially movable by virtue of the spring-mounting to the test circuit. When a pico fuse is open or shorted, this condition can be readily indicated by controlling the lighting of an LED lamp built into the detector body, that is actuated by a typical oscillation circuit built into one of the probe arms and powered by a battery built into the other probe arm. The circuit operates to cause the LED 30 to flash when the contacts of the two probes are shorted through the pico fuse being tested, or to light steadily or go off when the link across the probes contacts is open due to an open fuse.
申请公布号 US6252410(B1) 申请公布日期 2001.06.26
申请号 US19990240461 申请日期 1999.01.29
申请人 TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD 发明人 FAN CHEN MEI
分类号 G01R31/07;(IPC1-7):G01R31/02;G01R1/06 主分类号 G01R31/07
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