发明名称 SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREOF
摘要 PURPOSE: A semiconductor device and a manufacturing method thereof are provided to be capable of improving the degree of integration. CONSTITUTION: The first to third protrusion(31,32,33) are spaced apart from each other at a semiconductor substrate. A floating gate(24) is formed at both sidewalls of the first and third protrusion. A control gate(27) is formed by an anisotropic etching process for enclosing the floating gate. The second gate is formed at both sidewalls of the second protrusion by carrying out an anisotropic etching process. An interlayer dielectric(39) is deposited on the entire surface of the resultant structure. An upper line(40) is formed on the interlayer dielectric for being electrically connected with the second protrusion.
申请公布号 KR100301588(B1) 申请公布日期 2001.06.26
申请号 KR19990006420 申请日期 1999.02.26
申请人 SEMICONDUCTOR ENERGY LABORATORY K.K. 发明人 YAMAZAKI SHUNPEI;TAKEMURA YASUHIKO
分类号 H01L27/11;H01L21/8247;H01L27/115;(IPC1-7):H01L27/11 主分类号 H01L27/11
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