发明名称 Method and system for improving transmission of light through photomasks
摘要 The present invention provides a method and system for improving the transmission of light through a photomask. The method includes providing a photomask substrate, and applying at least one anti-reflection coating to at least one side of the photomask substrate. The anti-reflection coating reduces the loss of light during lithography due to reflections. This increases the efficiency of the lithography. The method and system has the added advantage of reducing the amount of undesired exposure of a photoresist.
申请公布号 US6251545(B1) 申请公布日期 2001.06.26
申请号 US19990357422 申请日期 1999.07.20
申请人 ADVANCED MICRO DEVICES, INC. 发明人 LEVINSON HARRY J.
分类号 G03F1/00;G03F1/14;(IPC1-7):G03F9/00 主分类号 G03F1/00
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