| 摘要 |
The invention provides a system and method for normalizing and calibrating a sensor array. The sensor array can comprise differential element sensors, such as for example eddy current sensors, or absolute sensors. A single test specimen is used to normalize and calibrate the sensor array using one or more scans of the test specimen. Notably, only one alignment of the sensor array to the test specimen is required. The test specimen is preferably made of the same or similar type of material as the part to be tested and is of a similar geometric shape that can have a simple flat surface or a more complex surface. A linear feature and several notches are machined into the surface of the specimen by using, for example, electro-discharge machining methods, to provide the necessary signals when scanned by the sensor array. Signals from the linear feature on the test specimen are used to remove any bias and to normalize the dynamic ranges of all of the sensors in the array. Signals from the notches are used to establish the gain settings for the sensors in the array.
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