发明名称 |
SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREFOR |
摘要 |
PURPOSE: To increase a surface area by controlling the surface morphology of a storage node electrode at a capacity part. CONSTITUTION: A capacity part comprising at least a capacity insulating film 2 and a storage node electrode 1 contacting to the capacity insulating film 2 is provided. Here, a high melting-point metal nitride film is formed as the storage node electrode 1 into a form having a specified surface morphology, with the capacity insulating film 2 formed on the storage node electrode 1.
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申请公布号 |
KR20010051216(A) |
申请公布日期 |
2001.06.25 |
申请号 |
KR20000062633 |
申请日期 |
2000.10.24 |
申请人 |
NEC CORPORATION;TOKYO ELECTRON LIMITED |
发明人 |
KAMIYAMA SATOSHI;KAWANO YUMIKO;YAMASAKI HIDEAKI |
分类号 |
H01L27/04;H01L21/822;H01L21/8242;H01L27/108;(IPC1-7):H01L27/108 |
主分类号 |
H01L27/04 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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