发明名称 APPARATUS AND METHOD OF SYLILATION
摘要 PURPOSE: An apparatus and a method of sylilation are to provide a uniform sylilated layer, without depending on the hardware constitution. CONSTITUTION: An apparatus and a method include carrying of a wafer W into a processing chamber, setting it while keeping a prescribed distance from a hot plate(5) established in the processing chamber, filling the processing chamber with a sylilation agent by introducing steam which contains a sylilation agent into the processing chamber heating the hot plate(5), bringing the wafer W close to the hot plate(5), uniformly spreading the sylilation agent atmosphere in the processing chamber at a temperature, at which the wafer W does not generate sylilation reaction, raising the temperature of the wafer W by bringing it close to the hot plate(5), and generating sylilation reaction on the surface of the wafer W.
申请公布号 KR20010051729(A) 申请公布日期 2001.06.25
申请号 KR20000067984 申请日期 2000.11.16
申请人 TOKYO ELECTRON LIMITED 发明人 OMORI TSUTAE;TOSHIMA TAKAYUKI;YAMASHITA MASAMI
分类号 H01L21/205;G03F7/20;G03F7/26;H01L21/00;(IPC1-7):H01L21/205 主分类号 H01L21/205
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