发明名称 RESIST BANKING SYSTEM AND BAKING METHOD
摘要 PURPOSE: To prevent variations in accuracy of an element pattern due to changes in the thickness of resist film, where the substrate as a whole cannot be heated uniformly. CONSTITUTION: A baking system includes a baking plate 1, having a transformable substrate mounting part 2 and an inner space part 3, and a temperature adjuster 4 joined with the baking plate 1 for circulating temperature adjusting liquid 7 in the space part 3.
申请公布号 KR20010051151(A) 申请公布日期 2001.06.25
申请号 KR20000061773 申请日期 2000.10.20
申请人 NEC CORPORATION 发明人 SHINOHARA MASAKI
分类号 H01L21/027;G02F1/13;H01L21/00;(IPC1-7):H01L21/027 主分类号 H01L21/027
代理机构 代理人
主权项
地址