| 摘要 |
PURPOSE: The event tester architecture for mixed signal integrated circuit is provided to test a mixed signal device by including test modules which have different capabilities, so testing a digital and analog function simultaneously. CONSTITUTION: This semiconductor test system includes a tester module having two or more different types of performances, a test head having two or more types of test modules having analog and digital types of performances combined by two or more pieces with each other and mounted thereto, a means for electrically connecting the test module to a tested device, an additional circuit provided between the test module and tested device according to the analog function block and the digital function block of the tested device, and a host computer controls the operation of the entire system by communicating with the test module mounted on the test head through a system bus.
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