发明名称 |
POSITIVE RESIST COMPOSITION |
摘要 |
PURPOSE: A chemical amplification type positive photoresist composition is provided to ensure improved edge roughness of a pattern and to give an excellent resist pattern profile with high sensitivity. CONSTITUTION: A positive type resist composition contains a compound which generates an acid when irradiated with active light or radiation and a resin containing an alkali-soluble group protected with at least one specified alicyclic hydrocarbon-containing partial structure, having 5% or less monomer content based on the entire pattern area by gel permeation chromatography(GPC) and having the rate of dissolution in an alkali developing solution increased by the acid.
|
申请公布号 |
KR20010050903(A) |
申请公布日期 |
2001.06.25 |
申请号 |
KR20000058916 |
申请日期 |
2000.10.06 |
申请人 |
FUJI PHOTO FILM CO., LTD. |
发明人 |
AOAI TOSHIAKI;KODAMA KUNIHIKO;SATO KENICHIRO |
分类号 |
G03F7/004;G03F7/039;(IPC1-7):G03F7/039 |
主分类号 |
G03F7/004 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|