| 摘要 |
PURPOSE: To provide a single semiconductor test system capable of running a plurality of the same or different types of test programs parallel with each other by a plurality of virtual testers. CONSTITUTION: This semiconductor test system comprises a host computer controlling the execution of the total test of a semiconductor test system using test programs, a plurality of pin units applying a test pattern to each corresponding tested semiconductor device (DUT) so as to evaluate the response signal of the semiconductor device, pin unit buses provided between the host computer and the plurality of pin units for transferring data, addresses, control signals, and clock signals therebetween, and a means forming the allocation of pin units correspondingly to the input pins and output pins of the tested device when a single address or a group selection address is fed to the pin unit buses by the host computer.
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