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发明名称
METHOD AND APPARATUS FOR BUILT-IN SELF TEST OF INTEGRATED CIRCUITS
摘要
申请公布号
KR20010052985(A)
申请公布日期
2001.06.25
申请号
KR1020007014379
申请日期
2000.12.18
申请人
发明人
分类号
G11C7/00
主分类号
G11C7/00
代理机构
代理人
主权项
地址
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