| 摘要 |
PROBLEM TO BE SOLVED: To diagnose the operating condition of a semiconductor integrated circuit by minimizing the number of connecting wires connected to the semiconductor integrated circuit. SOLUTION: This semiconductor integrated circuit with a diagnostic function is equipped with a scan chain forming block 2 having plural flip-flops shift- resistibly composed and a scan path design, a shift resister 3 to store random number patterns shifted by the block 2 enough for required bits, a shift resister 4 to store random number patterns supplied to the block 2 enough for required bits, and a comparator 5 to compare the bits corresponding respectively to each random pattern in the shift resisters 3, 4, and to detect whether all bits of each random pattern are in conformity with each other or not.
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