| 摘要 |
PROBLEM TO BE SOLVED: To shorten a period for the development of a DRAM mixedly mounted LSI. SOLUTION: A trial-production inspection integrated circuit on which a memory chip 8 manufactured in advance in a separate process is mounted is formed in the formation region of the memory part of a trial-production chip 7, which is manufactured in the production process of a microcomputer and on which a microcomputer-part function is mounted. The inspection integrated circuit is evaluated. When a result is good by iys evaluation, the DRAM mixedly mounted LSI is manufactured finally. |
