发明名称 INSPECTION DEVICE FOR MICRO OBJECT
摘要 PROBLEM TO BE SOLVED: To provide an inspection device for micro object capable of efficiently performing the classification between non-defective and defective with a simple structure. SOLUTION: This micro object inspecting device 1 comprises a fixed table 4 arranged so that the end surface is vertically raised with a slight distance from the discharge part 2b of a feeder 2, the table 4 having a suction opening 4A, an imaging opening 4B and a plurality of feeding openings 4D-4F successively and circularly arranged on the end surface; a rotating table 3 rotatably provided on the end surface of the fixed table 4, the table 3 having a plurality of pockets 3a extended through to both sides thereof and circularly arranged thereon; and cameras 5A-5F provided in the positions moving the space between the rotating table 3 and the discharge part 2b of the feeder 2 and the positions mutually opposed through the imaging opening 4B of the fixed table 4.
申请公布号 JP2001165623(A) 申请公布日期 2001.06.22
申请号 JP19990351429 申请日期 1999.12.10
申请人 HYUU BRAIN:KK 发明人 KAMATA YOSHIHIKO
分类号 G01B11/02;G01B11/30;(IPC1-7):G01B11/02 主分类号 G01B11/02
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