| 摘要 |
An electric device 100 has a conversion unit 102, and a SIGMA DELTA modulator 106 which functions as a D/A converter is included therein. The electric device 100 inputs an indication signal 40 for requesting a shift to test mode. The electric device testing apparatus 10 has an analog test pattern generator 16 for generating a pattern for testing an analog unit 108 of the electric device 100. The pattern generated herein is a digital signal. Consequently, after it is converted to an analog signal by the SIGMA DELTA modulator 106, a testing process is performed.
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