发明名称 METHOD OF ACHIEVING HIGHER INVERSION LAYER MOBILITY IN SILICON CARBIDE SEMICONDUCTOR DEVICES
摘要 The invention provides a method for the production of high quality thermally grown oxide on top of silicon carbide. The high quality oxide is obtained by selectively removing the carbon from the silicon carbide in the areas where oxide formation is desired or required. The method includes the steps of: (a) amorphizing the silicon carbide in at least one region of a monocrystalline silicon carbide substrate by ion implantation; (b) removing at least an effective amount of the carbon resulting from amorphizing the silicon carbide with an etchant effective to selectively remove carbon from the amorphized silicon carbide to produce an amorphous silicon-rich region; and (c) forming an oxide on the etched surface to provide a device which has an oxide region on (1) either an amorphous silicon-rich region which is (i) predominantly or entirely amorphous silicon or (ii) a mixture of predominantly amorphous silicon in combination with minor amounts of amorphous silicon carbide and/or silicon dioxide or (2) a monocrystalline silicon region; wherein (1) or (2) is present on a region of a silicon carbide substrate, or (3) a region of a silicon carbide substrate.
申请公布号 WO0145148(A1) 申请公布日期 2001.06.21
申请号 WO2000EP12146 申请日期 2000.12.01
申请人 KONINKLIJKE PHILIPS ELECTRONICS N.V. 发明人 ALOK, DEV
分类号 H01L21/308;H01L21/04;H01L21/20;H01L21/265;H01L21/336;H01L29/12;H01L29/24;H01L29/78 主分类号 H01L21/308
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