发明名称 Apparatus for sputter deposition
摘要 In one embodiment of this invention, the apparatus for sputter deposition within an evacuated volume comprises a compact gridless ion source into which an ionizable gas is introduced and from which ions leave with directed energies at or near the sputtering threshold and a sputter target near that source, biased negative relative to the surrounding vacuum enclosure, and located within the beam of ions leaving that source. Particles sputtered from the target are deposited on a deposition substrate spaced from both the ion source and the sputter target. An energetic beam of electrons can be generated by the incident ions striking the negatively biased sputter target and the deposition substrate is located either within or outside of this beam, depending on whether the net effect of bombardment by energetic electrons is beneficial or detrimental to that particular deposition process.
申请公布号 US2001004047(A1) 申请公布日期 2001.06.21
申请号 US20010766069 申请日期 2001.01.19
申请人 KAUFMAN & ROBINSON, INC. 发明人 KAHN JAMES R.;KAUFMAN HAROLD R.;ZHURIN VIACHESLAV V.;BALDWIN DAVID A.;HYLTON TODD L.
分类号 C23C14/46;H01J37/317;H01J37/34;(IPC1-7):C23C14/34 主分类号 C23C14/46
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