发明名称 Two dimensional stress relaxation testing device
摘要 The present invention relates to a two dimensional stress relaxation testing device in which a plus shaped sample is stretched in mutually perpendicular directions simultaneously to monitor the stress and also the relaxation process of any sheet material in both axes. In view of this advantage, the present device provides the closest approximation to the in situ failure of the material.
申请公布号 US6247370(B1) 申请公布日期 2001.06.19
申请号 US19990362282 申请日期 1999.07.27
申请人 COUNCIL OF SCIENTIFIC AND INDUSTRIAL RESEARCH 发明人 RAMASWAMY SANJEEVI;DEIVASIGAMANI NARESH MANDYAM;VISWANATHAN ARUMUGAM;SASTHRI SOMANATHAN NARAYANA;SUBRAMANIAM MUTHUKRISHNAN;KRISHNASWAMY KALAIARASU
分类号 G01N3/02;G01N3/08;G01N3/32;G01N33/44;(IPC1-7):G01N3/02;G01N3/00 主分类号 G01N3/02
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