发明名称 Method for forming an interconnect structure
摘要 In one embodiment, a masking chuck (68) is placed in contact with an integrated circuit structure (70) that contains conductive members (90). The masking chuck (68) is used to deposit a dielectric layer (92) on the integrated circuit structure (70). The dielectric layer (92) is then cured, and the masking chuck (68) is separated from the integrated circuit structure (68) to define openings (96) within the dielectric layer (92) which expose a portion of the underlying conductive members (90). A conductive layer (100) is then deposited in the openings (96), and polished to form conductive members (102) within the openings (96), which are electrically shorted to the underlying conductive members (90).
申请公布号 US6248659(B1) 申请公布日期 2001.06.19
申请号 US19990441811 申请日期 1999.11.17
申请人 CHARTERED SEMICONDUCTOR MANUFACTURING, LTD. 发明人 LIANG RANDALL CHA CHER;CHAN LAP
分类号 H01L21/768;H01L23/532;(IPC1-7):H01L21/476;H01L21/44 主分类号 H01L21/768
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