| 摘要 |
A gunning transceiver logic input circuit is provided a construction, in which a high potential power source for a differential input circuit and a high potential power source for an internal CMOS circuit are mutually separated and independent of each other, upon performing an IDDQ test as a static current measuring test for an LSI including the differential input circuit flowing a steady-state current and an internal CMOS circuit not flowing the steady-state current. Upon IDDQ test, IDDQ test becomes possible to perform power supply from the power source independent from the power source of other CMOS circuit.
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